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Home > Products > Thin Films: Film Thickness Measurement

Film Thickness Measurement


aRTie Thin Film Measurement

aRTie

aRTie represents a breakthrough in spectral reflectometer affordability and ease-of-use.
Technology From: Filmetrics

Spectral Reflectance & Transmittance Measurement

aRTie from Filmetrics represents a breakthrough in spectral reflectometer affordability and ease-of-use. Time consuming reference readings and minutes-long lamp warm-ups are a thing of the past. Simply plug aRTie into your computer's USB port and you're ready to go. aRTie's 40,000-hour light source and on-board spectroscopic calibration mean that maintenance is nil and measurement confidence is high.

Key Features
  • Reference and background steps are not required
  • Powered through USB cable - no other connections or set up required
  • Start the software and in 10 seconds aRTie is ready to go
  • 40,000-hour light source
  • Automatic on-board wavelength calibration
  • Measures spectral R, T, R+T, A(=1-R-T), and colour of flat specular samples
  • Film thickness and refractive index analysis optional
  • 380-1050nm wavelength range
  • UV and NIR versions coming soon
pdf aRTie Press Release (50KB)
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Automated Mapping Systems

Automated Mapping Systems

Warsash Scientific source instrumentation for fully-automatic mapping of thickness and index for nearly any sample shape.
Technology From: Filmetrics

Automated Mapping Systems

Warsash Scientific source instrumentation for fully-automatic mapping of thickness and index for nearly any sample shape. Manual-load and robotic-load systems are also available.

Products
  • F50: Adds automated mapping capabilities to the F20 family of products. Map thickness and index as fast as two points per second
  • F60-t: Production-ready table top thickness mapping system includes on-board reference, notch finding, interlocked cover and more
  • F60-c: Cassette-to-cassette version of the F60-t. Supports up to 300mm wafers
  • F80-t: Production-ready table top patterned wafer thickness mapping system, capable of 15-points in 21 seconds
  • F80-c: Cassette-to-cassette version of the F80-t. Supports up to 300nm wafers
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Inline Monitoring

Inline Monitoring

Inline monitoring allows you to monitor and control thickness of moving films during production.
Technology From: Filmetrics

Inline Monitoring

Inline monitoring allows you to monitor and control thickness of moving films during production. Sample rates as high as 100 Hz are possible at multiple measurement locations.

Products
  • F30: Monitor reflectance, thickness and deposition rates during MOCVD, sputtering and virtually any other deposition process
  • F37: Monitors reflectance, thickness and deposition rates at up to seven locations simultaneously
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Microscope - Spot Measurements

Microscope - Spot Measurements

These products are used when a measurement spot as small as 2.5µm is required.
Technology From: Filmetrics

Microscope - Spot Measurements

These products are used when a measurement spot as small as 2.5µm is required. Instrumentation can be adapted to an existing microscope or we can supply an entire system.

Products
  • F40: Attaches to an existing microscope to measure thickness and index in spots as small as 2.5µm
  • F40-UV: Measures films down to 4nm thick
  • F40-NSR: Integrates seamlessly onto your NanoSpec™ 180/210 System
  • F42: Provides 2-D thickness maps with sub-micron grid spacing
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Single Spot Measurements

Single Spot Measurements

Warsash Scientific offer a range of Table Top Systems for measuring film thickness and refractive index with a single mouse click.
Technology From: Filmetrics

Single Spot Measurements

Warsash Scientific offer a range of Table Top Systems for measuring film thickness and refractive index with a single mouse click, enabling thickness measurements from 1nm to 3.5mm, even within multilayer film stacks.

Products
  • F20: The world's best-selling table top film thickness measurement system. Available with a wide range of accessories and thickness coverage
  • F10-RT: Measures reflectance and transmittance simultaneously. Options available for thicknesses and index measurement
  • F10-AR: Measures reflectance of ophthalmic lenses and other curved surfaces. Options available for transmittance and hardcoat thickness measurement
  • PARTS: Measures complex film stacks by combining Perpendicular and Angled Reflectance, Transmittance and Scatterometry
  • F10-HC: Measures hardcoat and anti-fog film thickness and index. Popular in automotive and other industries that hardcoat polycarbonate
  • F10-PA: Provides hands-free parylene thickness measurement
  • F70: Measure the thickness of any transparent material up to 3.5mm thick
pdf Press Release F70 Transparent Film Measurement (65KB)
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Accessories

Accessories

Warsash Scientific offer a variety of accessories to meet your film thickness measurement needs.
Technology From: Filmetrics

Accessories

Warsash Scientific offer a variety of accessories from Filmetrics to meet your film thickness measurement needs.

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margin-right:165px;">Presented By: Filmetrics

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All products and information are subject to change without notice.