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Home > Products > Nanometrology & Surface Characterisation: Atomic Force Microscopes (AFM)

Atomic Force Microscopes (AFM)


NX10

NX10

The NX10, the world's most accurate AFM, brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers.
Technology From: Park Systems

NX10

The NX10, the world's most accurate AFM

Atomic Force Microscope
, brings unparalleled imaging accuracy, scan speeds, and tip life to the next generation of researchers, all at an affordable price. It is the world's premium research-grade True Non-Contact AFM, featuring industry-leading Z-servo speed, XYZ scanner linearity, closed-loop detector noise, and minimised thermal drift. As a user-friendly AFM, the NX10 makes AFM convenient and intuitive for new and experienced users alike.

Key Features
  • Accurate AFM Imaging by Crosstalk Elimination
  • Industry leading XYZ scan linearity with two independent flexure scanners for sample and tip
  • Best out-of-plane motion of less than 1nm over entire XY scan range
  • Z scanner linearity of less than 0.015%
  • Reduced XY scanner ringing by forward sine-scan algorithm
  • Accurate AFM Scan by True Non-Contact Mode™
  • Industry leading Z-scanner bandwidth of more than 9kHz, or Z-servo speed of more than 62mm/sec tip velocity
  • Fastest scan speed in non-contact mode imaging
  • Less tip wear for prolonged high-quality scans
  • Minimised sample damage or modification
  • Accurate AFM Measurement by True Sample Topography™
  • Sample topography measured by industry leading low noise Z detector
  • Industry leading, small forward and backward scan gap of less than 0.15%
  • Minimised system drift and hysteresis by thermally matched components
  • Active temperature control of acoustic enclosure
  • NX User Productivity
  • Easy tip exchange with wide open side access to the tip and sample
  • Easy, intuitive laser alignment with pre-aligned tip mount and patented on-axis, top down view
  • Fast automatic tip approach to sample surface within 10 seconds
  • 24 bit digital electronics with three internal lock-ins, Q-control, and spring constant calibration
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margin-right:165px;">Presented By: Park Systems

NX10 Atomic Force Microscope



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NX20

NX20

Park NX20, with its reputation as the world's most accurate large sample AFM, is rated so highly in the semiconductor and hard disk industry for its data accuracy.
Technology From: Park Systems

NX20

The NX20 is equipped with unique features that make it easier to uncover the reasons behind device failure and develop more creative solutions. Its unparalleled precision provides high resolution data that lets you focus on your work, while its True Non-Contact™ mode scan keeps tips sharper and longer, so you won't have to waste as much time and money replacing them.

The NX20 has one of the most user friendly designs and automated interfaces in the industry.

Key Features
  • Accurate AFM solutions for FA and research laboratories
  • Accurate and reproducible measurements
  • Accurate AFM topography
  • Low-noise Z Detector
  • Long tip life
  • True Non-Contact™ mode
  • Minimised sample damage
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XE7

Park XE7

The XE7 has been designed with the same attention to detail as other, more advanced models, at a cheaper price.
Technology From: Park Systems

Park XE7

The Park XE7 provides accurate measurement at highest nanoscale resolution than any other products in its class. It allows you to obtain sample images and its characteristic measurements true to its nano structure thanks to its flat, orthogonal, and linear scan measurements by its unique AFM architecture: independent XY and Z, flexure based scans. Furthermore, a unique True Non-Contact™ mode provides the sharpest images without declining resolution.

Key Features
  • Accurate XY scan by Corsstalk Elimination
  • Excellent tip life
  • Resolution and sample preservation with non-contact mode
  • Comprehensive range of SPM modes and sample measurement options
  • User-friendly design
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XE15

Park XE15 Atomic Force Microscope

This large sample AFM provides researchers and operators with the ability to automatically image and measure up to nine individual samples.
Technology From: Park Systems

Park XE15

The Park XE15 is a powerfully versatile atomic force microscope (AFM) featuring a unique MultiSample™ scan. XE15 can easily scan larger samples of up to 200mm x 200mm, a vast improvement from the current AFM products on the market. The AFM is ideally suited for shared labs environments that handle a diverse range of samples, researchers doing multi variant experiments, and failure analysis engineers working on wafers.

Key Features
  • Convenient sample measurements
  • Accurate scans with Crosstalk Elimination
  • Better tip life
  • Sample preservation
  • True non-contact mode
  • User friendly design and interface
  • Versatile range of modes and options
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XE-120

XE-120

The XE-120 is an exceptional AFM with expanded sample and interactivity flexibility.
Technology From: Park Systems

XE-120

The XE-120 is an exceptional AFM

Atomic Force Microscope
with expanded sample and interactivity flexibility. It is a research grade AFM with the industry's only True Non-Contact mode™ imaging for both air and liquid imaging. Flexible configurations allow integration with other advanced optical measurement techniques such as Raman spectroscopy.

Key Features
  • Artefact Free Imaging by Crosstalk Elimination
  • Two independent, closed- loop XY and Z flexure scanners for sample and tip
  • Out of plane motion of less than 2nm over entire scan range
  • Flat and linear XY scan of up to 100µm × 100µm with low residual bow
  • Up to 25µm Z-scan by high force scanner
  • Accurate height measurements
  • Ultimate AFM Resolution by True Non-Contact Mode™
  • 10 times larger Z-scan bandwidth than a piezotube
  • Less tip wear for prolonged high-quality and high-resolution imaging
  • Minimised sample damage or modification
  • Immunity from parameter-dependent results observed in tapping imaging
  • User Convenience by EZ Design
  • Open side access for easy sample or tip exchange
  • Dovetail-lock mount for easy head removal
  • Direct on-axis optics for high resolution optical viewing
  • Motorised optics stage
  • Advanced Optical Integration and Option Compatibility
  • Integrated with inverted optical microscopes
  • Tight mechanical coupling yields excellent noise performance
  • Compatible with both reflection and transmission optical viewing
  • Open side access for optical coupling such as Raman spectroscopy for TERS
    Tip enhanced Raman Spectroscopy
  • Access to all advanced SPM
    Scanning Probe Microscopy
    modes and options
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XE-Bio

XE-Bio

The modular design of the XE-Bio allows easy exchange between non-contact AFM and ICM.
Technology From: Park Systems

XE-Bio

XE-Bio is a powerful 3-in-1 nanoscience research tool that uniquely combines the industry's only True Non-Contact AFM

Atomic Force Microscope
with Ion Conductance Microscopy (ICM) and inverted optical microscope on the same platform. The modular design of the XE-Bio allows easy exchange between non-contact AFM and ICM
Ion Conductance Microscopy
. Designed for non-invasive in-liquid imaging, the combined imaging capability of AFM, ICM, and inverted optical microscopy makes the XE-Bio ideal for imaging biological samples, such as living cells, in dynamic conditions. Moreover, ICM can be adapted to enable a host of powerful applications in nanoscale electrophysiology.

Key Features
  • Powerful 3-in-1 Nanoscale Research Tool with Modular Platform
  • True Non-Contact Atomic Force Microscope (AFM)
  • Ion Conductance Microscope (ICM)
  • Inverted Optical Microscope
  • Ultimate AFM Resolution by True Non-Contact Mode™
  • 10 times larger Z-scan bandwidth than a piezotube
  • Less tip wear for prolonged high-quality and high-resolution imaging
  • Minimised sample damage or modification
  • Immunity from parameter-dependent results observed in tapping imaging
  • Single molecule Force-Distance spectroscopy with automated data analysis
  • Non-invasive In-liquid Imaging by ICM
  • Monitoring ion channels of single living cells
  • Unique functional capability of targeted localised stimulation
  • Enable nanoscale patch-clamping for electrophysiology
  • Environmental chamber for temperature, pH, and humidity control
  • Fully Integrated Inverted Optical Microscope
  • Compatible with phase contrast and DIC
    Differential Interference Contrast
    imaging
  • Also compatible with fluorescence microscopy
  • Advanced image overlay functions
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Industrial AFM

Industrial AFM

Warsash Scientific can work with you to provide an Industrial AFM solution to suit your application.
Technology From: Park Systems

Industrial AFM

Park Systems offers fully-automated Atomic Force Microscopy systems designed for process monitoring and characterisation of critical topographies such as step heights, surface roughness, overhang and trench profiles, sidewall roughness, and critical angle measurements. Using an ultra-sharp tip that maintains its shape via True Non-Contact imaging mode, the XE-series AFM

Atomic Force Microscope
s create a high-resolution reconstruction of surfaces and three dimensional structures.

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margin-right:165px;">Presented By: Park Systems

XE-3DM Industrial AFM



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AFM Accessories


HF2PLL Phase-locked Loop

HF2PLL Phase-locked Loop

The HFPLL is a high-performance instrument combining two 50 MHz phase-locked loops with two independent 50 MHz lock-in amplifiers.
Technology From: Zurich Instruments

HF2PLL Phase-locked Loop

The HFPLL is a high-performance instrument combining two 50 MHz phase-locked loops with two independent 50 MHz lock-in amplifiers. The PLLs provide fully configurable support for accurate frequency tracking, while the lock-in amplifiers provide best-in-class signal recovery featuring the Zurich Instruments' unique 128 bit technology. With unprecedented capabilities, the HF2PLL embodies the new state-of-the-art for phase sensitive measurements and enables new applications in the high-frequency range.

Key Features
  • 2 50 MHz phase-locked loops
  • 2 independent fully configurable lock-in units
  • 2 high-frequency, high-performance signal generators
  • 50 kHz PLL bandwidth with full parameter control
  • Q-Control, increase and decrease
  • AFM pack (optional): automatic gain control, Kelvin probe feedback
  • Harmonic mode
  • State-of-the-art software integration
  • Easy to use HF2PLL Advisor tool
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Active Vibration Control

Active Vibration Control

The TS and AVI Series have been chosen by numerous instrument manufacturers and hundreds of research facilities worldwide as their vibration control solution.
Technology From: Herzan

Active Vibration Control

Employing sub-hertz isolation technology, the AVI and TS series are capable of providing any precision research instrument with proven vibration cancellation performance.

The TS and AVI Series have been chosen by numerous instrument manufacturers and hundreds of research facilities worldwide as their vibration control solution. Both systems continue to embody the highest performance/highest value solutions available in the research market.

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ELpF Lightweight Benchtop Vibration Isolation

ELpF LIGHTWEIGHT BENCHTOP VIBRATION ISOLATION

A low-profile, pneumatic vibration-free platform.
Technology From: Kinetic Systems

ELpF Lightweight Benchtop Vibration Isolation

Load Range: 68kg, 136kg max. (150lbs, 300lbs max.)

This lightweight, low-profile pneumatic vibration-free platform is designed to meet the exacting vibration-control requirements of sensitive equipment. A very low profile of only 76mm (3") nom., and light weight of only 18kg (40lbs), makes this an excellent choice for bench top vibration isolation applications. The clean ergonomic design makes this system ideal for use in cleanroom and laboratory environments.

The ELpF lightweight bench top vibration isolation system offers exacting vibration-control requirements for a wide range of applications including atomic force microscopes, microhardness testers, analytical balances, profilometers, audio equipment and other lightweight vibration sensitive equipment.

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Active Vibration Control Platforms

The 8001 Series

Active Vibration Control Platforms
Technology From: Kinetic Systems

Active Vibration Control Platforms

Load Range: Up to 272kg (600lbs)

This compact, lightweight floor mount or table top vibration isolation system senses and responds to provide superior vibration control over that possible with standard passive vibration isolation systems. A precise automatic level adjustment mechanism adjusts for varying loads without user reconfiguration.

The 8001 Series active vibration isolation system offers the ultimate vibration control performance for a wide range of high resolution instruments such as SPM

Statistical Parametric Mapping
, interferometer and microscopy.

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All products and information are subject to change without notice.