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Microscopes


UVM-1™ Ultraviolet Microscope

UVM-1™ Ultraviolet Microscope

The UVM-1™ is a UV microscope that also can image in the visible and NIR.
Technology From: CRAIC

UVM-1™ Ultraviolet Microscope

The UVM-1™ is a UV microscope that also can image in the visible and NIR. This UV-visible-NIR microscope embodies both advanced optics for cutting edge UV, colour and NIR imaging and visualisation. The system is a flexible design, very easy to use and very durable. It is designed with cutting edge CRAIC optics for the highest image quality and to give years of service.

The UVM-1 UV microscope can image in transmission, reflectance, polarisation and even in fluorescence from the UV, visible, and NIR regions with high spatial resolution, all with the same microscope and without swapping components.

Key Features
  • Deep UV microscopy
  • Visible range microscopy
  • NIR microscopy
  • Ultraviolet-visible-NIR imaging in one shot without changing optics
  • Raman spectroscopy of microscopic samples
  • Transmission, reflectance, fluorescence, and polarisation imaging of microscopic samples
  • True high resolution digital imaging and direct visualisation through eyepieces
  • Easy to use and maintain
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Surface Metrology

Surface Metrology

The AVT-1000 Advanced Vibrometry Tester enables you to measure all critical parameters such as roughness, waviness, and defects across the whole surface of the sample providing important information for process optimisation.
Technology From: Polytec

Surface Metrology

Hard disk drives are manufactured with nanometre precision. The slightest change in manufacturing can cause surface roughness variations large enough to cause failures in the field. For the best yields it is necessary to optimise your process. Measuring and understanding the characteristics of your product allows continuous improvement.

The AVT-1000 Advanced Vibrometry Tester enables you to measure all critical parameters such as roughness, waviness, and defects across the whole surface of the sample providing important information for process optimisation. No other technique can give you such precise, quick, and full surface measurement results.

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SAW & RF MEMS Analysers

SAW & RF MEMS Analysers

Complete with a new optical design, the instrument retains the advantages and features familiar to laser vibrometer users.
Technology From: Polytec

SAW & RF MEMS Analysers

The UHF-120 Vibrometer can characterise the out-of-plane vibrations at ultra-high frequencies, extending the vibration frequency bandwidth up to 1.2GHz. Complete with a new optical design, the instrument retains the advantages and features familiar to laser vibrometer users.

The system consists of a heterodyne interferometer with a controller box. The optical head provides a heterodyne detector signal that is acquired with a fast digital oscilloscope. The digitized detector signal is transferred to a PC where the heterodyne carrier is demodulated by a new software module in Polytec's Vibsoft package.

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All products and information are subject to change without notice.